Shirai Y., Nitta T.(nitta@asc.t.u-tokyo.ac.jp), Baba J.(j-baba@k.u-tokyo.ac.jp), Hayashi Y.(hayashi@asc.t.u-tokyo.ac.jp)
Ключевые слова: SMES, power reactive, experimental results, converters, power equipment
Watanabe T., Mimura M., Ohashi Y., Maeda T.(maeda.toshihiko@furukawa.co.jp), Nagasu Y.
Ключевые слова: HTS, coated conductors, substrate Ni-V, substrate Ni-W, mechanical properties, microstructure
Shiohara Y., Takahashi Y.(k920112@snt1.swcc.co.jp), Aoki Y., Hasegawa T., Maeda T., Honjo T., Yamada Y.
Ключевые слова: HTS, YBCO, coated conductors, MOD process, substrate Ni, buffer layers, microstructure, critical current density, fabrication, critical caracteristics
Ключевые слова: FCL rectifier type, HTS, Bi2223, tapes, coils model, breakdown characteristics, insulating medium, voltage waveforms, current leads, test results, power equipment
Tsukamoto O., Ogawa J., Murakami M., Tomita M., Zushi Y., Asaba I., Yamagishi K.(kazu@tsukalab.dnj.ynu.ac.jp)
Torii S., Ueda K., Yamaguchi M., Kobayashi Y., Fukui S.(fukui@eng.niigata-u.ac.jp), Sato T., Nakayama H.
Ключевые слова: HTS, Bi2223/Ag, tapes monofilamentary, ac losses, experimental results
Takahashi Y., Kato T., Honjo S., Masuda T., Fujikami J., Yumura H., Okazaki T., Matsuo K., Mimura T.
Ключевые слова: HTS, ac losses, numerical analysis, patents, cables, power equipment
Tasaki K., Kuriyama T., Nomura S., Takahashi Y., Hobara N., Koyama H., Ohkuma T.(ohkuma.takeshi@tepco.co.jp), Inoue K.(super-gm@nifty.com), Yazawa T.(takashi.yazawa@toshiba.co.jp)
Ключевые слова: FCL rectifier type, HTS, Bi2223, tapes, coils, cooling technology, critical current, current distribution, test results, power equipment, critical caracteristics
Shintomi T., Ise T.(ise@pwr.eng.osaka-u.ac.jp), Furukawa K., Kobayashi Y., Kumagai S., Sato H.
Ключевые слова: SMES, synchrotron, numerical analysis, modeling, power equipment
Nishijima G., Koizumi N., Matsui K., Ando T., Okuno K., Takahashi Y., Isono T., Sugimoto M., Nunoya Y.(nunoya@naka.jaeri.go.jp)
Takahashi Y., Honjo S., Shimodate M.(shimodate.masato@tepco.co.jp), Masuda T., Yumura H.(yumura-hiroyasu@sei.co.jp), Suzawa C.(suzawa-chizuru@sei.co.jp), Isojima S., Suzuki H.(ksuzuki@criepi.denken.or.jp)
Ключевые слова: HTS, Bi2223, tapes, cables cold-dielectric, critical current, ac losses, test results, power equipment, critical caracteristics
Takahashi Y., Honjo S., Masuda T., Watanabe M.(m-watanabe@sei.co.jp), Ashibe Y.(ashibe@sei.co.jp), Hirose M.(hirose-masayki@sei.co.jp), Isojima S.(isojima-shigeki@sei.co.jp), Uchiyama T.(uchiyama.toshiyuki@tepco.co.jp), Shimodate M., Suzuki H.
Ключевые слова: HTS, Bi2223, tapes, cables cold-dielectric, mechanical properties, cooling technology, heat losses, test results, power equipment
Shiohara Y., Takahashi Y.(k920112@snt1.swcc.co.jp), Aoki Y., Hasegawa T., Watanabe T., Maeda T., Honjo T.
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni, MOD process, buffer layers, microstructure, experimental results, fabrication, magnetic properties
Tsukamoto O., Kikukawa K., Suzuki E., Ogawa J.(jun@tsukalab.dnj.ynu.ac.jp), Zushi Y., Fukushima M., Hirakawa M.
Kuriyama T., Nomura S., Funaki K., Hayashi H., Tsutsumi K., Tasaki K.(kenji2.tasaki@toshiba.co.jp), Sumiyoshi Y., Kimura H., Iwakuma M.
Watanabe T., Maeda T., Mimura M., Ohashi Y., Hirabayashi I.(hirazum@istec.or.jp)
Iijima Y., Shiohara Y., Aoki Y., Hasegawa T., Watanabe T., Maeda T., Honjo T., Yamada Y., Saito T., Hirabayashi I., Takahashi Y.*(k920112@sntl.swcc.co.jp))
Ключевые слова: HTS, cables, current distribution, anisotropy, numerical analysis, power equipment
Takao T., Ito T., Takahashi Y., Umekawa K., Yamaguchi M., Kondo J., Umeda M.(m.umeda@aist.go.jp)
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